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Metallurgical Microscope LD-LMM-C10

Metallurgical Microscope LD-LMM-C10

SKU: LD-LMM-C10

Metallurgical MicroscopeLD-LMM-C10is specifically designed for industrial purpose. Features superior quality Infinity M Plan APO HL objective (visible) with long working distance, double layer stage, trinocular head, rotatable analyzer, filters namely blue and green, quintuple nosepiece etc. which makes it highly efficient and reliable. It has wide applications in metal industry, mineral industry and electrical industry.

  • ✓ Infinity Optical system
  • ✓ Adopts M Plan APO HL objective (visible)
  • ✓ M Plan APO HL objective (NIR and NUV) is optional
  • ✓ Long working distance objective
  • ✓ Quintuple nosepiece
  • ✓ Green, blue, neutral filter
  • ✓ Movable polarizer and analyser
  • ✓ Positive and Negative imaging is customisable
  • ✓ Options like automatic focusing, motorised stage and auto nosepiece are available
  • ✓ Software can also be provided
Also available in:
Viewing head : Trinocular head, inclined at 30º
Interpupillary distance 48-75 mm
Viewing head : Siedentopf type trinocular head inclined at 30º, Rotable 360 º
interpupilary distance: 48-76 mm
Optical System : Infinity Optical System
(with Bright Field/ Dark Field, DIC, Polarizing units)
Optical System : Infinity Optical System
(with Bright Field/ Dark Field, DIC, Polarizing units)
Optical System : Infinity Optical System F= 200 mm Optical System : UIS optical system
StageDouble layers stage 230×280 mm
moving range: 150×150 mm
FilterGreen, Blue, Neutral
Weight39.1 kg
EyepieceWF10X/25 mm
FocusingCoaxial coarse and fine with rack and pinion, coarse range 40 mm, fine scale value 0.002 mm
OptionalMaterial Plus Software
Dimension540×580×530 mm
NosepieceQuintuple, objective screw M26×0.706
PolarizingAnalyzer rotatable 360°
polarizer and analyzer can be moved out/in
IlluminationReflected halogen 12 V 50 W, Adjustable, with aperture and field iris diaphragm
Viewing HeadSiedentopf trinocular head, inclined at 30°, Interpupillary 55-75 mm
Optical SystemInfinity Optical System F= 200 mm

It is used to inspect semiconductor chips, integrated circuits, structures of metals and alloys etc.

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