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Atomic force microscope LD-LAFM-A11

Atomic force microscope LD-LAFM-A11

SKU: LD-LAFM-A11

Atomic force microscopeLD-LAFM-A11comes with combined design of scan head and sample stage, to give strong anti-vibration performance. Adopted with servomotor, drives the sample approaching tip manually or automatically, to evaluate precise scanning area position. Equipped with precision laser detection and probe alignment device, make easy adjustment of laser beam.

  • ✓ Large sample transfer range
  • ✓ Optical observation system for checking tip & sample’s position
  • ✓ Modular electronic system for easy maintenance
  • ✓ CCD observing system
  • ✓ Equipped with servomotor to achieve CCD auto focusing
  • ✓ Provides highly accurate results
Also available in:
Operation modes : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle Operation modes : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
Scan rate0.6 Hz to 4.34 Hz
Net weight50 kg
ResolutionX/Y axis: 0.2 nm, Z axis: 0.05 nm
Scan angle0 to 360°
Sample sizeØ≤ 90 mm, H≤ 20 mm
Gross Weight87.4 kg
Feedback typeDSP digital feedback
Operation modesContact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
PC connections:USB 2.0
Sample movement0 to 20 mm
Scanning controlXY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Windows softwareCompatible with windows 98/2000/XP/7/8
Maximum scan rangeX/Y axis: 50 µm, Z axis: 5 µm
Instrument Diemnsion700 × 500 × 460 mm
Feedback sampling rate64 KHz
Types of sampling pixel256×256, 512×512
Pulse width of approaching motor10 ± 2 ms
Optical system/ Magnification of CCDMagnification: 10x, Resolution: 1 µm

It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

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