Analytical-Instruments > Spectrophotometer > NIR-Spectrophotometer > Vis Spectrophotometer LD-LVS-C10
Features
- Wavelength range of 320 ~ 1100 nm Large LCD display with 128 × 64 bit
- Standard curve measurement function with ten standard sample
- With general purpose parallel printer port and USB interface
- Large sample cell(~ 5 mm to 100 mm)
- Colour filter automatic switching
- Auto wavelength setting
- Can achieve more accurate and flexible measurement requirements
Vis Spectrophotometer LD-LVS-C10
Visible spectrophotometerLD-LVS-C10comes with large memory space which can store multiple sets of data & curves. With wavelength range of 320 ~ 1100 nm, standard curve for quantitative measurement can be established in simple method. It has with monolithic, microprocessor controlled LCD display of 128 × 64 bit. Quantitative measurement of standard curve is established through direct input of K & B factor. It is useful in scientific research and industries for detection of impurities and other elements.
SKU Code: LD-LVS-C10
Also Available in below capacities
Wavelength Range : 330 to 1000 nm
Wavelength Range : 335 ~ 1000 nm
Wavelength Range : 325 ~ 1000 nm
Wavelength Range : 320 ~ 1100 nm
Wavelength Range : 320 ~ 1000 nm
Photometry : Single Beam
- Specifications
- Product Applications
| Power | 120 W |
| Weight | 11 kg |
| Detector | Import Silicon Photodiode Detector |
| Stability | 0.001 A / h 30 min at 500 nm |
| Dimensions | 480 × 350 × 220 mm |
| Display LCD | Display resolution 128 × 64 Dots LCD |
| Stray Light | ≤ 0.05 % τ |
| Light Source | Import Tungsten Lamp |
| Wavelength Range | 320 ~ 1100 nm |
| Photometric Range | (-0.3) ~ 3 A |
| Power Requirement | AC 220 V / 50 Hz, 110 V / 60 Hz. |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ± 0.5 nm |
| Photometric Accuracy | ± 0.3 % T |
| Wavelength Repeatability | ≤ 0.2 nm |
| Photometric Repeatability | 0.15 % τ |
| It is useful in scientific research and industries for quantitative and qualitative analysis, detection of impurities and functional groups determination. |
