XRF-Spectrometer LD-LXRF-A11
SKU: LD-LXRF-A11The Labodam XRF-Spectrometer LD-LXRF-A11 is designed for non-destructive elemental analysis of precious metals in jewellery and other sample materials. Using X-ray fluorescence technology, the instrument identifies elements through their characteristic secondary X-ray emissions and determines their concentration from the measured fluorescence intensity.
- ✓ Non-destructive X-ray fluorescence analysis for rapid elemental identification and quantification
- ✓ Supports analysis of more than 60 elements from potassium (K) to uranium (U)
- ✓ Si PIN semiconductor detector provides elemental X-ray detection
- ✓ Single sample chamber simplifies sample placement and measurement
- ✓ Integrated X-ray tube, amplifier circuit, and high- and low-voltage power supplies
- ✓ Non-Vacuum chamber supports the X-ray measurement system
- ✓ Element concentrations are determined through calibrated X-ray fluorescence intensity
- ✓ Designed for precious-metal analysis, including platinum, palladium, rhodium, gold, iridium, and other alloying elements
Also available in:
Measureable elements : S to U
| Weight | 20 kg |
| Power Supply | AC 110/220 V |
| X-Ray Source | X-Ray Tube |
| Measurement Time | 60–300s |
| Measurement Range | 1 ppm–99.99% |
| Measuring Objects | Powder, Solid and Liquid |
| Relative Humidity | ≤70% |
| Measurement Precision | 0.05% (>96%) |
| Ambient Temperature Range | 15–30°C |
| Analytical Range of Elements | More than 60 elements, K to U |
Suitable for elemental analysis of precious-metal jewellery, metal alloys, powders, solids, and liquids in jewellery manufacturing, precious-metal testing, quality control, material analysis, laboratories, and research applications.
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