XRF-Spectrometer LD-LXRF-A10
SKU: LD-LXRF-A10XRF-SpectrometerLD-LXRF-A10is a microprocessor controlled high-count throughput unit with low detection limits for wide range of elements. Provision of multi-elemental analysis with detection limits upto 1 ppm. Built-in movable platform for easy location of testing point.High resolution detector improves analysis accuracy. Equipped with safety features of optical tube shielding with no X-ray radiation and high voltage emergency locking.
- ✓ Detection limit – 1 ppm
- ✓ Measureable elements – S to U
- ✓ Elemental content – 1 ppm to 99 %
- ✓ Movable sample platform for easy detection of testing point
- ✓ Built-in electric cooling Si-PIN detector
- ✓ Safety features - optical tube shielding with no X-ray radiation and high voltage emergency locking
Also available in:
Measureable elements : S to U
| Weight | 45 kg |
| Stability | 0.001 |
| Dimensions | 550 x 410 x 320 mm |
| Temperature | 15 ~ 30 °C |
| Power supply | AC 220 V ± 5 V |
| Repeatability | 0.001 |
| Detection limit | 1 ppm |
| Elemental content | 1 ppm to 99 % |
| Measureable elements | S to U |
Used in detection of plating thickness of metals, concentration of plating solution , RoHS detection and analysis, full-element analysis and electro plating industries
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XRF-Spectrometer LXRF-B10
✓ Analytical Method : Energy dispersive X-ray fluorescence analytical Method
✓ Elements Measuring : Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured
