Analytical-Instruments > Spectrometer > ICP-Spectrometer > XRF-Spectrometer LD-LXRF-A11
Features
- Non-destructive X-ray fluorescence analysis for rapid elemental identification and quantification
- Supports analysis of more than 60 elements from potassium (K) to uranium (U)
- Si PIN semiconductor detector provides elemental X-ray detection
- Single sample chamber simplifies sample placement and measurement
- Integrated X-ray tube, amplifier circuit, and high- and low-voltage power supplies
- Non-Vacuum chamber supports the X-ray measurement system
- Element concentrations are determined through calibrated X-ray fluorescence intensity
- Designed for precious-metal analysis, including platinum, palladium, rhodium, gold, iridium, and other alloying elements
XRF-Spectrometer LD-LXRF-A11
The Labodam XRF-Spectrometer LD-LXRF-A11 is designed for non-destructive elemental analysis of precious metals in jewellery and other sample materials. Using X-ray fluorescence technology, the instrument identifies elements through their characteristic secondary X-ray emissions and determines their concentration from the measured fluorescence intensity.
SKU Code: LD-LXRF-A11
Also Available in below capacities
Measureable elements : S to U
- Specifications
- Product Applications
| Weight | 20 kg |
| Power Supply | AC 110/220 V |
| X-Ray Source | X-Ray Tube |
| Measurement Time | 60–300s |
| Measurement Range | 1 ppm–99.99% |
| Measuring Objects | Powder, Solid and Liquid |
| Relative Humidity | ≤70% |
| Measurement Precision | 0.05% (>96%) |
| Ambient Temperature Range | 15–30°C |
| Analytical Range of Elements | More than 60 elements, K to U |
| Suitable for elemental analysis of precious-metal jewellery, metal alloys, powders, solids, and liquids in jewellery manufacturing, precious-metal testing, quality control, material analysis, laboratories, and research applications. |
