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XRF-Spectrometer LD-LXRF-A11

XRF-Spectrometer LD-LXRF-A11

SKU: LD-LXRF-A11

The Labodam XRF-Spectrometer LD-LXRF-A11 is designed for non-destructive elemental analysis of precious metals in jewellery and other sample materials. Using X-ray fluorescence technology, the instrument identifies elements through their characteristic secondary X-ray emissions and determines their concentration from the measured fluorescence intensity.

  • ✓ Non-destructive X-ray fluorescence analysis for rapid elemental identification and quantification
  • ✓ Supports analysis of more than 60 elements from potassium (K) to uranium (U)
  • ✓ Si PIN semiconductor detector provides elemental X-ray detection
  • ✓ Single sample chamber simplifies sample placement and measurement
  • ✓ Integrated X-ray tube, amplifier circuit, and high- and low-voltage power supplies
  • ✓ Non-Vacuum chamber supports the X-ray measurement system
  • ✓ Element concentrations are determined through calibrated X-ray fluorescence intensity
  • ✓ Designed for precious-metal analysis, including platinum, palladium, rhodium, gold, iridium, and other alloying elements
Also available in:
Measureable elements : S to U
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Weight20 kg
Power SupplyAC 110/220 V
X-Ray SourceX-Ray Tube
Measurement Time60–300s
Measurement Range1 ppm–99.99%
Measuring ObjectsPowder, Solid and Liquid
Relative Humidity≤70%
Measurement Precision0.05% (>96%)
Ambient Temperature Range15–30°C
Analytical Range of ElementsMore than 60 elements, K to U

Suitable for elemental analysis of precious-metal jewellery, metal alloys, powders, solids, and liquids in jewellery manufacturing, precious-metal testing, quality control, material analysis, laboratories, and research applications.

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